Figure legends
Figure 1. Schematic diagram of the experimental design used to
assess within and transgenerational effects of thermal variability on
critical thermal limits, and demographic parameters in D.
melanogaster . Offspring and parental generation were reared in one of
two thermal environments, constant (C) or variable (V), described in the
right panel (variable cycles included 8 h at 24ºC, 8 h at 32ºC and 8 h
of ramping, see Methods). Abbreviations represent the thermal treatments
for the parental generation (C and V) and the offspring (CC, CV, VV and
VC).
Figure 2. Critical thermal limits (CTmax(a) and CTmin, (b)) and demographic parameters
(\(R_{0}\) (c) and\(\ T_{g}(d\)) in our experimental groups. Parental
flies (P) and their offspring (F1) were reared in a constant (C, 28 ±
0ºC) or variable (V, 28 ± 4ºC) thermal environment. Solid and dashed
lines in the right panels represent similar or alternate thermal
environments between P and F1 (see Figure 1). Colored points represent
the thermal environment experienced by flies. Values are shown as mean ±
SE.
Figure 3. Survival (a and b) and fecundity (c and d) of P and
F1 flies of D. melanogaster reared in a constant (C, 28 ± 0 ºC)
or a variable thermal environment (V, 28 ± 4 ºC). In colors thermal
treatments for parental generation (C and V, left panels) and their
offspring (CC, CV, VC, VV, right panels). Solid and dashed lines in the
right panels represent similar or alternate thermal environments between
P and F1 (see Figure 1).