Figure legends
Figure 1. Schematic diagram of the experimental design used to assess within and transgenerational effects of thermal variability on critical thermal limits, and demographic parameters in D. melanogaster . Offspring and parental generation were reared in one of two thermal environments, constant (C) or variable (V), described in the right panel (variable cycles included 8 h at 24ºC, 8 h at 32ºC and 8 h of ramping, see Methods). Abbreviations represent the thermal treatments for the parental generation (C and V) and the offspring (CC, CV, VV and VC).
Figure 2. Critical thermal limits (CTmax(a) and CTmin, (b)) and demographic parameters (\(R_{0}\) (c) and\(\ T_{g}(d\)) in our experimental groups. Parental flies (P) and their offspring (F1) were reared in a constant (C, 28 ± 0ºC) or variable (V, 28 ± 4ºC) thermal environment. Solid and dashed lines in the right panels represent similar or alternate thermal environments between P and F1 (see Figure 1). Colored points represent the thermal environment experienced by flies. Values are shown as mean ± SE.
Figure 3. Survival (a and b) and fecundity (c and d) of P and F1 flies of D. melanogaster reared in a constant (C, 28 ± 0 ºC) or a variable thermal environment (V, 28 ± 4 ºC). In colors thermal treatments for parental generation (C and V, left panels) and their offspring (CC, CV, VC, VV, right panels). Solid and dashed lines in the right panels represent similar or alternate thermal environments between P and F1 (see Figure 1).