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\begin{document}

\title{Perovskite mini modules: over 30 years of lifetime projected via thermal
stress testing}



\author[1]{Abdurashid Mavlonov}%
\author[1]{Yoshihiro Hishikawa}%
\author[1]{Yu Kawano}%
\author[1]{Takayuki Negami}%
\author[2]{Akinobu Hayakawa}%
\author[2]{Sho Tsujimura}%
\author[2]{Takuro Okumura}%
\author[1]{Takashi Minemoto}%
\affil[1]{Ritsumeikan Daigaku - Biwako Kusatsu Campus}%
\affil[2]{Sekisui Kagaku Kogyo Kabushiki Kaisha Kaihatsu Kenkyujo}%


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  \date{May 23, 2024}


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\begin{abstract}
The stability of methylammonium lead iodide (MAPbI
\textsubscript{3})-based flexible perovskite (PVK) mini modules was
studied under thermal stress. For this purpose, PVK mini modules,
consisting of 10 serially connected cells with an aperture area of 9 cm
\textsuperscript{2}, were subjected to elevated temperatures of 85,
95, and 105 for 4000 h. The photovoltaic (PV) parameters of PVK mini
modules were periodically measured by interrupting the thermal stress
tests. Evolution of series resistance, short circuit current, and fill
factor showed monotonic reduction, whereas shunt resistance and open
circuit voltage depicted three stage degradation: (i) initial rapid
degradation; (ii) quasi stable range; and (iii) gradual monotonic
degradation stages, which are the indication for the presence of several
degradation mechanisms. Using the experimental data, activation energy (
\emph{E} \textsubscript{a}) of degradation was studied by adopting the
Arrhenius model. \emph{E} \textsubscript{a} of 1.062 eV (102.5 kJ/mol)
was obtained for the maximum output of the total device. Device
lifetime, which is defined as the point where the efficiency has reduced
to 80\% of its initial value, 30.6 years was estimated, i.e.,
performance loss of around 0.65\% per year, at module temperature of
45.%
\end{abstract}%



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\textbf{Hosted file}

\verb`pip-24-135-File001.docx`  available at \url{https://authorea.com/users/774033/articles/868058-perovskite-mini-modules-over-30-years-of-lifetime-projected-via-thermal-stress-testing}

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